Zeiss GeminiSEM300
1192
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Designation

Zeiss GeminiSEM300

Manufacturer

Zeiss

Model

GeminiSEM300

Accelerating Voltage

0.1 kV - 30 kV (FEG)

Modes

- High vacuum mode (4.8 10e-5 Pa)

- Controled pressure mode (up to 500 Pa)

Electron source

FEG ( Field Electron Gun) Schottky type

Detectors

- 2 detectors in column (secondary and backscattered)

- 5 detectors in chamber (secondary for high vacuum, retractable backscattered, secondary and backscattered nano-VP, STEM detector)

Theoretical Resolution

0.8 nm @ 15 kV and 1.4 nm @ 1 kV

Applications

- In cryo-observation

- Serial Block Face Imaging (SBF)

- Microanalysis X (semi-quantitative analysis ; elementary mapping with Bruker detector)

- Scanning Transmission Electron Microscopy (STEM)

Category
Electronic imaging